SU-FF-T-163 |
Quantitative Verification of IMRT Intensity Maps Using An Amorphous Silicon Electronic Portal Imager |
Byline |
B Yao*, W Peng, L Santanam, F Van den Heuvel, J Burmeister, Barbara Ann Karmanos Cancer Institute, Wayne State Univ, Detroit, MI
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Contact
Email |
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Document Files |
Proffered Abstract |
18-3107-447-910.pdf |
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