Performance Characterization of a New 41cm by 41cm A-Si Flat Panel X-Ray Detector
Byline
L Axmann, R Bachmann, R Burchert, M Maolinbay*, J Zhao, B Giambattista, , Wiesbaden, , DE, PerkinElmer Optoelectronics, Inc, Santa Clara, CA, PerkinElmer Optoelectronics, Santa Clara, CA