MO-E-332-7 |
Instrumentation Noise Equivalent Exposure (INEE) for Routine Quality Assurance: INEE Measurements On a Clinical Flat Panel Detector |
Byline |
T Szczykutowicz *, A Kuhls-Gilcrist , D Bednarek , S Rudin , University at Buffalo, Toshiba Stroke Research Center, Buffalo, NY
|
Contact
Email |
|
Document Files |
Proffered Abstract |
35-8889-78645-207.pdf |
|
|