Effect of Point Spread Function, X-Ray Quantum Noise, and Additive Instrumentation Noise On the Accuracy of the Angulated Slit Method for Determination of Pre-Sampled Detector MTF
Byline
A Jain*, A Kuhls-Gilcrist, V Patel, K Hoffmann, D Bednarek, S Rudin, Toshiba Stroke Research Center, University at Buffalo, Buffalo, NY