2010 AAPM Annual Meeting
Program
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Abstract Information
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Session Information
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Meeting Home
Monday, July 19, 2010
Abstract Information
Moderated Poster - Measurements: Calibrations II
Monday
4:45:00 PM - 5:30:00 PM
Room: Exhibit Hall - Area 2
MO-FF-A2-3
A Method for Measuring X-Ray Beam Profiles Using a Flat Panel Detector
Byline
M Sun*, J Star-Lack, G Virshup, Varian Medical Systems, Ginzton Technology Center, Mountain View, CA
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Document Files
Proffered Abstract
49-12960-28790-871.pdf