Multi-Detector CT Dose Index Assessment with MOSFET Technology
Byline
T Yoshizumi*1, D Frush1, E Samei1, P Goodman1, P Simoni2, G Toncheva1, G Nguyen1, L Barnes1, C Lowry1, (1) Duke University Medical Center, Durham,NC , (2) GE Medical Systems, Waukesha ,WI