49th AAPM Annual Meeting Program
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Thursday, July 26, 2007  
Image and Observer Performance- Modeling and Measurement
Thursday 10:00:00 AM - 12:00:00 PM  Room: L100F

TH-C-L100F-2 Instrumentation Noise Equivalent Exposure (INEE) and the Effect of Detector Blurring and Image Post-Process Smoothing: A Simulation Study
Byline G Yadava*, S Rudin, A Kuhls, D Bednarek, Toshiba Stroke Research Center, University at Buffalo (SUNY), Buffalo, NY
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Document Files
Proffered Abstract 29-6838-15244-124.pdf