SU-FF-T-120 |
Comparison of Detectors for Electron Depth-Dose Measurements and Investigation of Parallel-Plate Chamber Perturbation Factors |
Byline |
M McEwen*1, A McDonald 1, B Faddegon 2, (1) National Research Council, Ottawa, ON, (2) UC San Francisco, San Francisco, CA
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Contact
Email |
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Document Files |
Proffered Abstract |
29-6875-76513-338.pdf |
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