48th AAPM Annual Meeting Program
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Tuesday, August 1, 2006  
Moderated Poster - Area 4 (Imaging) Radiography and Fluoroscopy
Tuesday 4:45:00 PM - 5:30:00 PM  Room: Exhibit Hall F

TU-FF-A4-1 Instrumentation Noise Equivalent Exposure (INEE) Representation for High Sensitivity X-Ray Imaging Detectors
Byline G Yadava*, S Rudin, A Kuhls, V Patel, D Bednarek, K Hoffmann, University at Buffalo (SUNY) School of Medicine and Biomedical Sciences, Toshiba Stroke Research Center, Buffalo, NY
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Document Files
Proffered Abstract 26-4694-43210-724.pdf