SU-DD-A4-6 |
Instrumentation Noise Equivalent Exposure (INEE): An Investigation of Spatial Frequency Effects |
Byline |
A Kuhls-Gilcrist*, A Jain, D Bednarek, S Rudin, University at Buffalo, Toshiba Stroke Research Center, Buffalo, NY
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Contact
Email |
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Document Files |
Proffered Abstract |
35-8637-33438-899.pdf |
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