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WE-C-304A-8 |
The Instrumentation Noise Equivalent Exposure (INEE): Including Conversion, Secondary Quantum, Structure and Electronic Noise |
| Byline |
A Kuhls-Gilcrist*, D Bednarek, S Rudin , University at Buffalo, Toshiba Stroke Research Center, Buffalo, NY
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| Contact
Email |
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| Document Files |
| Proffered Abstract |
42-10683-4551-271.pdf |
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