51st AAPM Annual Meeting Program
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Sunday, July 26, 2009  
Abstract Information
Imaging General Poster Discussion
Sunday 3:00:00 PM - 4:30:00 PM  Room: Exhibit Hall

SU-FF-I-108 Effect of Point Spread Function, X-Ray Quantum Noise, and Additive Instrumentation Noise On the Accuracy of the Angulated Slit Method for Determination of Pre-Sampled Detector MTF
Byline A Jain*, A Kuhls-Gilcrist, V Patel, K Hoffmann, D Bednarek, S Rudin, Toshiba Stroke Research Center, University at Buffalo, Buffalo, NY
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Document Files
Proffered Abstract 42-10550-38989-837.pdf