51st AAPM Annual Meeting Program
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Wednesday, July 29, 2009  
Abstract Information
Radiography, Fluoroscopy and Imaging Performance
Wednesday 10:00:00 AM - 12:00:00 PM  Room: 304A

WE-C-304A-8 The Instrumentation Noise Equivalent Exposure (INEE): Including Conversion, Secondary Quantum, Structure and Electronic Noise
Byline A Kuhls-Gilcrist*, D Bednarek, S Rudin , University at Buffalo, Toshiba Stroke Research Center, Buffalo, NY
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Document Files
Proffered Abstract 42-10683-4551-271.pdf