2010 AAPM Annual Meeting Program
Please note: If you are seeing small squares on your abstract document, you need to update to the latest version of Adobe Acrobat Reader.
amos v.2
  Abstract Information | Session Information | Meeting Home
 
Monday, July 19, 2010  
Abstract Information
Moderated Poster - Measurements: Calibrations II
Monday 4:45:00 PM - 5:30:00 PM  Room: Exhibit Hall - Area 2

MO-FF-A2-3 A Method for Measuring X-Ray Beam Profiles Using a Flat Panel Detector
Byline M Sun*, J Star-Lack, G Virshup, Varian Medical Systems, Ginzton Technology Center, Mountain View, CA
Contact Email
Document Files
Proffered Abstract 49-12960-28790-871.pdf