Program Information
Are Small Field Detector Correction Factors Strongly Dependent On Machine-Specific Characteristics?
D Mathew*, S Tanny , E Parsai , N Sperling , University of Toledo Medical Center, Toledo, OH
Presentations
SU-C-304-7 (Sunday, July 12, 2015) 1:00 PM - 1:55 PM Room: 304
Purpose:The current small field dosimetry formalism utilizes quality correction factors to compensate for the difference in detector response relative to dose deposited in water. The correction factors are defined on a machine-specific basis for each beam quality and detector combination. Some research has suggested that the correction factors may only be weakly dependent on machine-to-machine variations, allowing for determinations of class-specific correction factors for various accelerator models. This research examines the differences in small field correction factors for three detectors across two Varian Truebeam accelerators to determine the correction factor dependence on machine-specific characteristics.
Methods:Output factors were measured on two Varian Truebeam accelerators for equivalently tuned 6 MV and 6 FFF beams. Measurements were obtained using a commercial plastic scintillation detector (PSD), two ion chambers, and a diode detector. Measurements were made at a depth of 10 cm with an SSD of 100 cm for jaw-defined field sizes ranging from 3x3 cm2 to 0.6x0.6 cm2, normalized to values at 5x5cm2. Correction factors for each field on each machine were calculated as the ratio of the detector response to the PSD response. Percent change of correction factors for the chambers are presented relative to the primary machine.
Results:The Exradin A26 demonstrates a difference of 9% for 6x6mm2 fields in both the 6FFF and 6MV beams. The A16 chamber demonstrates a 5%, and 3% difference in 6FFF and 6MV fields at the same field size respectively. The Edge diode exhibits less than 1.5% difference across both evaluated energies. Field sizes larger than 1.4x1.4cm2 demonstrated less than 1% difference for all detectors.
Conclusion:Preliminary results suggest that class-specific correction may not be appropriate for micro-ionization chamber. For diode systems, the correction factor was substantially similar and may be useful for class-specific reference conditions.
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