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Program Information

Evaluation of a Scintillating Screen Detector for Proton Beam QA and Acceptance Testing

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A Ghebremedhin

A Ghebremedhin1*, M Taber1 , P Koss1 , G Camargo1 , S Ebstein2 , B Patyal1 , (1) Loma Linda University Medical Center, Loma Linda, CA, (2) Lexitek, Inc, Wellesley, MA


SU-F-T-180 (Sunday, July 31, 2016) 3:00 PM - 6:00 PM Room: Exhibit Hall

Purpose: To test the performance of a commercial scintillating screen detector for acceptance testing and Quality Assurance of a proton pencil beam scanning system.

Method: The detector (Lexitek DRD 400) has 40cm x 40cm field, uses a thin scintillator imaged onto a 16-bit scientific CCD with ~0.5mm resolution. A grid target and LED illuminators are provided for spatial calibration and relative gain correction. The detector mounts to the nozzle with micron precision. Tools are provided for image processing and analysis of single or multiple Gaussian spots.

Results: The bias and gain of the detector were studied to measure repeatability and accuracy. Gain measurements were taken with the LED illuminators to measure repeatability and variation of the lens-CCD pair as a function with f-stop. Overall system gain was measured with a passive scattering (broad) beam whose shape is calibrated with EDR film placed in front of the scintillator. To create a large uniform field, overlapping small fields were recorded with the detector translated laterally and stitched together to cover the full field. Due to the long exposures required to obtain multiple spills of the synchrotron and very high detector sensitivity, borated polyethylene shielding was added to reduce direct radiation events hitting the CCD. Measurements with a micro ion chamber were compared to the detector's spot profile. Software was developed to process arrays of Gaussian spots and to correct for radiation events.

Conclusion: The detector background has a fixed bias, a small component linear in time, and is easily corrected. The gain correction method was validated with 2% accuracy. The detector spot profile matches the micro ion chamber data over 4 orders of magnitude. The multiple spot analyses can be easily used with plan data for measuring pencil beam uniformity and for regular QA comparison.

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